| Acronym | Brief Description | 
|---|---|
| CLK | Clock | 
| GCK0 | Global Clock 0 | 
| GCK1 | Global Clock 1 | 
| GCK2 | Global Clock 2 | 
| GND | Ground | 
| GSR | Global Set/Reset | 
| GTS0 | Global Output Enable 0 | 
| GTS1 | Global Output Enable 1 | 
| GTS2 | Global Output Enable 2 | 
| GTS3 | Global Output Enable 3 | 
| I/O | Input/Output | 
| INIT | Initial state | 
| ISP | In system programmable | 
| JTAG | Joint Test Action Group | 
| KPR | Unused I/O with weak keeper | 
| NC | No Connects | 
| PGND | Programmable ground pin | 
| PROHIBITED | User reserved pin | 
| R | Reset | 
| S | Set | 
| TCK | Test clock | 
| TDI | Test data input | 
| TDO | Test data output | 
| TIE | Unused I/O floating | 
| TMS | Test mode select | 
| LVCMOS | Low Voltage CMOS 3.3 Volts | 
| LVCMOS25 | Low Voltage CMOS 2.5 Volts | 
| LVCMOS33 | Low Voltage CMOS 2.5 to 3.3 Volts | 
| LVTTL | Low Voltage TTL 3.3 Volts | 
| VCCIO | Input/Output Supply Voltage | 
| VCC | Power internal | 
| WPU | Weak Pull Up |